Emalj

Ämnesområden: Emalj
Kommittébeteckning: SIS/TK 116 (Oorganiska ytbeläggningar)
Källa: CEN
Svarsdatum: den 22 maj 2019
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This document specifies two low voltage tests for detecting and locating defects that extend to the basis metal in vitreous and porcelain enamel coatings.

Method A (electrical) is suitable for the rapid detection and determination of the general location of defects. Method B (optical), based on colour effects, is suitable for the more precise detection of defects and their exact locations. Both methods are commonly applied to flat surfaces. For more intricate shapes such as undulated and/or corrugated surfaces ISO 8289-2 has to be applied.

NOTE 1 Selection of the correct test method is critical to distinguish the areas of increased conductivity detected by Method B from actual pores that extend to the basis metal, which can be detected by both methods.

NOTE 2 The low voltage test is a non-destructive method of detecting defects (see Clause 3) and therefore, is completely different from the high voltage test specified in ISO 2746. The result of high and low voltage test are not comparable and will differ.