Nanoteknik

Ämnesområden: Nanoteknik
Kommittébeteckning: SIS/TK 516 (Nanoteknik)
Källa: ISO
Svarsdatum: den 8 nov 2018
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This International Standard specifies methods of determining nanoparticle size and shape distributions by acquiring and evaluating scanning electron microscope images and by obtaining and reporting accurate results.

NOTE 1 This International Standard applies to particles with a lower size limit that depends on the required uncertainty and on the suitable performance of the SEM, which must be proven first -according to the requirements described in this document.

NOTE 2 This International Standard applies also to SEM-based size and shape measurements of larger than nanoscale particles.

Ämnesområden: Nanoteknik
Kommittébeteckning: SIS/TK 516 (Nanoteknik)
Källa: ISO
Svarsdatum: den 20 nov 2018
Se merSe mindre
 

This International Standard provides guidance on how to capture, measure, and analyse transmission

electron microscopy images to obtain particle size and shape distributions in the nanoscale.

NOTE This International Standard broadly applies to nano‐objects as well as to particles with sizes larger than

100 nm. The exact working range of the method depends on the required uncertainty and on the performance of

the transmission electron microscope, which must be evaluated according to the requirements described in this

document.